Gaskleen® II Gas Purifier product photo Primary L

Gaskleen® II Gas Purifier

A unique combination of Pall's leading edge AresKleen purification material combined with Ultramet-L® stainless steel filter media creating the industry's most advanced true point-of-use purifier.

The Gaskleen® II Purifier assembly is designed to remove contamination from most process gases. Sub ppb level purification is achieved at designed flow rates of up to 3 slpm while providing 0.003 μm filtration.
  • Controls and reduces impurities such as O2, H2O, CO2, CO, NMHC, Ni(CO)4 and Fe(CO)5
  • One-for- one dimensional replacement of conventional in-line particle filter assemblies
  • Assembly hardware is made of 316 L stainless steel
  • High efficiency diffusion barrier ensures integrity of reactive material during installation
  • Superior pressure drop characteristics
  • Wide variety of gases purified
  • 100% helium leak and pressure tested
  • Compact size
  • Not orientation sensitive
  • Does not generate hazardous waste when used in non-hazardous gas service
  • Will not release hydrocarbons
  • No detectable metal contribution above background in HCl gas with HCLP material
  • No detectable metal contribution above background in HBr gas with HBRP material
Products in this datasheet may be covered by one or more patents, including US 7,465,692


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A unique combination of Pall's leading edge AresKleen purification material combined with Ultramet-L® stainless steel filter media creating the industry's most advanced true point-of-use purifier.

The Gaskleen® II Purifier assembly is designed to remove contamination from most process gases. Sub ppb level purification is achieved at designed flow rates of up to 3 slpm while providing 0.003 μm filtration.
  • Controls and reduces impurities such as O2, H2O, CO2, CO, NMHC, Ni(CO)4 and Fe(CO)5
  • One-for- one dimensional replacement of conventional in-line particle filter assemblies
  • Assembly hardware is made of 316 L stainless steel
  • High efficiency diffusion barrier ensures integrity of reactive material during installation
  • Superior pressure drop characteristics
  • Wide variety of gases purified
  • 100% helium leak and pressure tested
  • Compact size
  • Not orientation sensitive
  • Does not generate hazardous waste when used in non-hazardous gas service
  • Will not release hydrocarbons
  • No detectable metal contribution above background in HCl gas with HCLP material
  • No detectable metal contribution above background in HBr gas with HBRP material
Products in this datasheet may be covered by one or more patents, including US 7,465,692

Materials

  • Electropolished 316 L stainless steel components
  • ≤ 10 μin / 0.25 μm Ra internal surface finish

Particle Removal Efficiency Rating

  • 1x109 retention of particles ≥ 0.003 μm up to 5 slpm

Connections

  • 14 in. Gasket Seal, Male/Male (VCR1 compatible)

Operating Conditions

  • Maximum Operating Pressure: 1000 psig / 69 bar
  • Maximum operating temperature:
    • 100 °C / 212 °F (INP, SIP, FCP, SF6P)
    • 40 ˚C / 104 ˚F (GEH4P, OXP, CLXP, HCLP, HBRP, CDAP)
  • EU Pressure Equipment Directive: Assemblies have been evaluated and are CE marked per the European Union's Pressure Equipment Directive 2014/68/EU

Design Flow Rate

  • 0- 3 slpm @ 15 psig / 1 bar
  • Higher intermittent flow rates of up to 5 slpm can be accommodated with reduced lifetime2

Packaging

  • Double bagged
  • Outer bag: aluminized mylar3
  • Inner bag: polyethylene
  • End fittings capped with metal seals
  • Product packaged in an argon environment

Dimensions

  • Length: 3.31 in. / 84 mm
  • Diameter: 1.36 in. / 34.5 mm
1 VCR is a trademark of Swagelok Co.
2 Contact the Pall Microelectronics Group for further information.
3 Mylar is a registered trademark of Dupont Teijin Films.


Technical Information

Impurity Removal as Tested in Specific Gases
Specific Gas Impurity Removal Efficiency
Inert Gases: Nitrogen, Argon, Helium, Xenon, Krypton, Neon < 1 ppb H2O, CO2, O2, and CO as tested in argon and nitrogen using APIMS analyzer
Flammable Gases: Silane, Hydrogen, Methane, Ethane, Cyclopropane, Propane, Dimethyl Ether < 1 ppb H2O, CO2, O2, and CO as tested in argon, nitrogen and hydrogen using APIMS analyzer

< 1 ppb H2O as tested in carbon monoxide using trace moisture analyzer

H2O and siloxanes removed to trace levels as tested in silane using APIMS
Carbon Monoxide < 1 ppb Ni(CO)4, and < 1 ppb Fe(CO)5 as tested in carbon monoxide using GC-ECD analyzer
Fluoromethane, Difluoromethane, Trifluoromethane, Tetrafluoroethane, Pentafluoroethane, Heptafluoropropane, Carbon Tetrafluoride, Perfluoropropane, Perfluorocyclobutane, Hexafluoroethane < 1 ppb H2O, CO2, O2, and CO as tested in argon and nitrogen using APIMS analyzer

< 1 ppb O2 as tested in trifluoromethane using trace oxygen analyzer

< 10 ppb H2O as tested in trifluoromethane using trace moisture analyzer and FTIR
Germane < 1 ppb H2O, CO2, O2, and CO as tested in argon and nitrogen using APIMS analyzer
Sulfur Hexafluoride < 1 ppb H2O, CO2, and O2 as tested in argon using APIMS
Oxygenated Gases: Carbon Dioxide, Oxygen, Nitrous Oxide, Clean Dry Air < 10 ppb H2O

< 1 ppb H2O, and CO2, as tested in argon using APIMS analyzer
Chlorinated Gases: Boron Trichloride, Chlorine, Trichlorosilane, Dichlorosilane < 100 ppb H2O

< 1 ppb H2O, and CO2, as tested in argon using APIMS analyzer
Hydrogen chloride < 15 ppb H2O as tested in hydrogen chloride using CRDS

< 1 ppb H2O as tested in argon using APIMS analyzer
Hydrogen Bromide < 50 ppb H2O as tested in hydrogen bromide using CRDS
< 1 ppb H2O as tested in argon using APIMS analyzer
Photolithography clean dry air < 1 ppb H2O as tested in argon using APIMS analyzer
< 300 ppt C4H8 as tested in argon using APIMS Analyzer
< 10 ppt SO2 as tested in nitrogen using ion chromatograph
< 15 ppt NH3 as tested in nitrogen using ion chromatograph
< 1 ppt HMDSO as tested in argon using APIMS analyzer and baseline subtraction

Unit conversion: 1 bar = 100 kilopascals

Pressure Drop vs. Gas Flow Rate

Pressure Drop vs. Gas Flow Rate GLP2INPVMM4

Lifetime Calculations

Pall AresKleen Purification Material: Inert Gas Service
Gaskleen II Purifier Assembly, Part # GLP2INPVMM4

Inlet Pressure: 30 psig (2.1 bar) Contaminant Challenge as H2O
Contaminant Challenge as H2O

Pall AresKleen Purification Material: Inert Gas Service Gaskleen II Purifier Assembly, Part # GLP2INPVMM4

Inlet Pressure: 30 psig (2.1 bar) Contaminant Challenge as O2
Contaminant Challenge as O2
Systems
Process gas purification, Process gas purification, Process gas purification

Dimensions

Dimensions
Part Number Specific Gas Effluent Purity Specifications
GLP2INPVMM4 Inert Gases: Nitrogen, Argon, Helium, Xenon, Krypton, Neon < 1 ppb H2O, O2, CO2, CO
GLP2SIPVMM4 Flammable Gases: Silane, Hydrogen, Methane, Ethane, Cyclopropane, Propane, Dimethyl Ether < 1 ppb H2O, CO2, O2, CO
  Carbon Monoxide < 1 ppb H2O, O2, CO2, Ni(CO)4, Fe(CO)5
GLP2FCPVMM4 Fluoromethane, Difluoromethane, Trifluoromethane, Tetrafluoroethane, Pentafluoroethane, Heptafluoropropane, Carbon Tetrafluoride, Perfluoropropane, Perfluorocyclobutane, Hexafluoroethane < 1 ppb H2O, CO2, O2
GLP2GEH4PVMM4 Germane < 1 ppb H2O, CO2, O2, CO
GLP2SF6PVMM4 Sulfur Hexafluoride < 1 ppb H2O, CO2, O2, CO
GLP2OXPVMM4 Oxygenated Gases: Carbon Dioxide, Oxygen, Nitrous Oxide < 10 ppb H2O
GLP2CLXPVMM4 Chlorinated Gases: Boron Trichloride, Chlorine, Trichlorosilane, Dichlorosilane < 100 ppb H2O
GLP2HCLPVMM4 Hydrogen Chloride < 15 ppb H2O
GLP2HBRPVMM4 Hydrogen Bromide < 50 ppb H2O
GLP2CDAPVMM4 Photolithography clean dry air < 1 ppb H2O, < 300 ppt organics (as C4), < 10 ppt acid gases (as SO2), < 15 ppt basic gases (as NH3), < 1 ppt refractory compounds (as HMDSO)

Unit conversion: 1 bar = 100 kilopascals
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